Large And Small SD Card Gold Point To DIP48 Double-Headed Needle Test Seat

Description

Performance Parameters:
1. Working frequency: low frequency
2. Application range: integrated circuit IC
3. Interface type: probe
4. Probe material: beryllium copper (standard)
5. Insulation material: FR-4, PPS, etc.

Features:
1. It adopts manual flip structure, which is easy to operate;
2. The product has a high degree of universality. As long as the limit frame is changed, all SD cards with the same pins and different dimensions can be tested;
3. The pressure plate of the upper cover adopts a special structure, and the downward pressure is stable to ensure that the pressure of the SD card is uniform and does not shift;
4. The high-precision positioning slot ensures accurate positioning of the SD card and high production efficiency;
5. Equipped with different main detection boards, can realize the interchangeability of Chipsbank, UT165, Anguo, SMI, NETWORK solutions
6. The probe can be replaced, the maintenance is convenient, and the cost is low;